National Institute of AerospaceUndergraduate Research Assistant
Jun. 2007 - Aug. 2007Worked under Dr. Mool Gupta from the Electrical Engineering Department.
Updated Dr. Gupta’s website using Dreamweaver. Measured directional reflectance to determine the emittance of Si, Ti, and stainless steel from 300 K to 2000 K using Spectra Optics’ SOC-400T FTIR spectrometer. Nanotexturing improved emittance by 0.18±0.02 in silicon, by 0.46±0.08 in titanium, by 0.35±0.09 in stainless steel.